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individual dopant atoms and clusters

"Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si",
P. M. Voyles, D. A. Muller, J. L. Grazul, P. H. Citrin, and H.-J. Gossmann,
Nature, 416 826-829 (2002).

New York Times: Scientists Get Atoms Ready for a Close-Up

ultra-thin gate oxides

"The electronic structure at the atomic scale of ultra-thin gate oxides",
D. A. Muller, T. Sorsch, S. Moccio, F. H. Baumann and G. Timp, Nature, 399, 758-761 (1999).

New York Times: WHAT'S NEXT; A Stay of Execution For the Silicon Chip
New York Times: ESSAY; Is Incredible Shrinking Chip Nearing End of the Line?

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