V L3 and L2 edges for different V formal oxidation states. The formal oxidation state is best tracked by the relative energy shift as the branching ratio is strongly affected by plural scattering from the valence losses and the presence of the O-K edge at ~528 eV
Comments
By: Lena Fitting Kourkoutis @ Cornell University
Microscope: FEI Tecnai F20
Reference: L. Fitting Kourkoutis, Y. Hotta, T. Susaki, H. Y. Hwang, and D. A. Muller, “Nanometer Scale Electronic Reconstraction at the Interface between LaVO3 and LaVO4“, Phys. Rev. Lett. 97, 256803 (2006)