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Spectra

By: Robert Hovden Microscope: 200 keV FEI Tecnai F20 equipped with a Gatan imaging filter 865-ER  Energy Resolution: 0.5eV

By: Yao Yang Microscope: Nion UltraSTEM (100 keV) Energy Resolution: 0.5 eV Note: The energy axis of the O edge has been calibrated using dual EELS map.  Ref: Yang, PNAS, 2019, 116, 24425

By: Yao Yang Microscope: Nion UltraSTEM (100 keV) Energy Resolution: 0.5 eV Note: The energy axis of the O edge has been calibrated using dual EELS map.  Ref: Yang, PNAS, 2019, 116, 24425

By: Judy Cha @ Cornell University Microscope: FEI Tecnai T20

By: Judy Cha @ Cornell University Microscope: FEI Tecnai T20 Note: This is from a MgB4O7 bulk powder. The first peak at 530 eV is molecular oxygen being released from the powder, which is a sign that it is being damaged.

By: David Muller Microscope: VG HB 501UX STEM Energy Resolution: 0.9eV Reference: “The electronic structure at the atomic scale of ultra-thin gate oxides”, D. A. Muller, T. Sorsch, S. Moccio, F. H. Baumann and G. Timp, Nature, 399, 758-761 (1999).

By: Peter Ercius and Jerome Hyun @ Cornell University Microscope: FEI Tecnai T20 Energy Resolution: 0.73eV Note: The energy axis of the CuO edge has been calibrated to the values reported by Leapman et al. in the paper: L.A. Grunes, R.D. Leapman, C.N. Wilker, R. Hoffman, A.B. Kunz. Phys. Rev. B 25, 7157 (1982).

By: Peter Ercius and Jerome Hyun @ Cornell University Microscope: FEI Tecnai T20 Energy Resolution: 0.73eV Note: The energy axis of the CuO edge has been calibrated to the values reported by Leapman et al. in the paper: L.A. Grunes, R.D. Leapman, C.N. Wilker, R. Hoffman, A.B. Kunz. Phys. Rev. B 25, 7157 (1982).

By: Jerome Hyun Microscope: VG HB 501UX STEM Energy Resolution: 0.68eV

By: David Muller Microscope: JEOL 2010F Energy Resolution: 1 eV Note: There is approximately a +3 eV shift in the edge onset from the Al metal to the CVD alumina and anodic alumina spectra

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